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Communication Dans Un Congrès Année : 2022

SuperCAST: a full free addressable memory array

Résumé

In this paper we present a full free addressable 4kb EEPROM memory array. This test structure based on CAST vehicle has been upgraded with flexible addressing logic to select any numbers of cells on single or multiple word lines. To this aim, column/row shift registers, to enable an easy cell biasing, have been implemented in an embedded non-volatile memory environment. High voltage circuits, driven by low voltage shift registers, are used to bias selected cells for electrical characterizations and reliability tests purposes. This kind of structure has been developed to improve the efficiency of electrical characterization laboratory, resulting in an enhanced acquisition with respect to standard CAST test techniques, opening the path to fine statistical analysis.
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Dates et versions

hal-04063478 , version 1 (17-04-2023)

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Vincenzo Della Marca, Julien Guilleau-Tavernier, Pierre Laine, Franck Melul, Marc Bocquet, et al.. SuperCAST: a full free addressable memory array. IEEE 34th International Conference on Microelectronic Test Structures (ICMTS 2022), Mar 2022, Cleveland, OH, United States. pp.1-4, ⟨10.1109/ICMTS50340.2022.9898189⟩. ⟨hal-04063478⟩
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