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Article Dans Une Revue IEEE Transactions on Nuclear Science Année : 2000

Incidence of multi-particle events on soft error rates caused by n-Si nuclear reactions

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hal-04056354 , version 1 (03-04-2023)

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Frédéric Wrobel, J.-M. Palau, M.C. Calvet, O. Bersillon, H. Duarte. Incidence of multi-particle events on soft error rates caused by n-Si nuclear reactions. IEEE Transactions on Nuclear Science, 2000, 47 (6), pp.2580-2585. ⟨10.1109/23.903812⟩. ⟨hal-04056354⟩
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