Statistical Analysis of Matching Properties of Randomly Distributed Thin and Thick Dipoles
Résumé
A statistical analysis of the matching properties of a dipole surrounded by thin and thick randomly distributed loaded dipoles is presented. The input impedance and input reflection coefficient of the driven dipole is obtained by
using the IEMF method and validated by NEC and measurements. The cumulative distributed functions are presented for different dipole densities and the mismatch of a surrounded thin or thick dipole is studied for different surrounding loads.
Domaines
Electromagnétisme
Origine : Fichiers produits par l'(les) auteur(s)