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Article Dans Une Revue IEEE Transactions on Electron Devices Année : 2023

A TCAD-based Analysis of Substrate Bias Effect on Asymmetric Lateral SiGe HBT for THz Applications

Résumé

In this work, a new asymmetric lateral SiGe HBT is proposed. This asymmetric structure allows one to modulate the carrier densities in the collector region by the application of substrate bias that causes significant improvements in the device performances. The open base breakdown voltage can be tuned from 2.2 V to 3.6 V and the transit frequency (f T) is improved up to ∼90% by varying the substrate bias. The bias-dependent variation in transit time is elaborately discussed using regional analysis. This work, for the first time, demonstrates an oscillation frequency (f MAX) of 2.7 THz achievable by tuning the substrate bias in an asymmetric SOI lateral SiGe HBT.

Domaines

Electronique
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Dates et versions

hal-04037634 , version 1 (20-03-2023)

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Citer

Soumya Ranjan Panda, Sebastien Fregonese, Pascal Chevalier, Anjan Chakravorty, Thomas Zimmer. A TCAD-based Analysis of Substrate Bias Effect on Asymmetric Lateral SiGe HBT for THz Applications. IEEE Transactions on Electron Devices, In press, ⟨10.1109/TED.2023.3251281⟩. ⟨hal-04037634⟩
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