Coextruded polypropylene/tie/ethylene vinyl alcohol/tie/polypropylene (PP/tie/EVOH/tie/PP) films often exhibit optical defects which appear as randomly distributed scattering objects, in the submillimeter range. These defects may strongly affect the film transparency and prevent their practical use in packaging. Based on an objective optical test aimed at quantifying the film transparency, and on a systematic analysis, through optical microscopy, of transverse cuts of films obtained in various coextrusion conditions, the nature of the defects could be identified as resulting from a modulation of the thickness of the inner ethylene vinyl alcohol (EVOH) layer, with no variation in the overall thickness of the multilayer films. Thanks to a recently developed method to dose the surface density of interfacial copolymers, a clear correlation between the amplitude of the thickness modulation of the inner EVOH layer and the density of copolymer molecules formed in situ at the EVOH/tie layer interface during the coextrusion process was established. These results open the way to a better design of tie layers composition to avoid these kinds of defects.