Combining in situ analysis of a painting with ToF-SIMS imaging of a sample to understand artistic practices - Archive ouverte HAL
Communication Dans Un Congrès Année : 2019

Combining in situ analysis of a painting with ToF-SIMS imaging of a sample to understand artistic practices

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Romain Berraud-Pache  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-04027552

Soumis le : lundi 13 mars 2023-21:51:37

Dernière modification le : jeudi 11 avril 2024-13:08:14

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hal-04027552 , version 1 (13-03-2023)

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  • HAL Id : hal-04027552 , version 1

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Philippe Walter, Alain Brunelle, Caroline Bouvier, Helen Glanville, Laurence de Viguerie, et al.. Combining in situ analysis of a painting with ToF-SIMS imaging of a sample to understand artistic practices. Advanced Mass Spectrometry In Cultural Heritage Symposium, Jun 2019, Bordeaux, France. ⟨hal-04027552⟩

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