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Article Dans Une Revue Microelectronics Reliability Année : 2022

Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA

Résumé

This article describes the development of a test bench so as to measure the ageing of 16 nm FinFETs used in a Zynq UltraScale+ FPGA from Xilinx. The Ring Oscillator (RO) drift measurement method was chosen and implemented in the setup. However, RO is a circuit sensitive not only to ageing but also to temperature and voltage. In order to mitigate the undesired sensitivity to temperature and voltage, we installed a regulation system to control the temperature and the internal voltage of the FPGA, and we characterised the RO frequency in function of the temperature and the voltage to apply post-measurement compensations. We improved the measurement circuit by using the GPS signal as a time reference. 1000 h test with (TFPGA = 100∘C) and (VFPGA = Vnom + 25%) was performed and results show clear RO frequency drifts lower than 0.1 % measured with an accuracy of 0.9 × 10−4.
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Dates et versions

hal-04017664 , version 1 (07-03-2023)

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Justin Sobas, Tudor-Bogdan Airimitoaie, Francois Marc. Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA. Microelectronics Reliability, 2022, 138, pp.114698. ⟨10.1016/j.microrel.2022.114698⟩. ⟨hal-04017664⟩
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