Diagnostic genomic profiling constitutes one of the major challenges to cure brain tumors. The deployment of such analyses depends on the quality of the surgical specimen sent for histopathological examination and further molecular studies. The aim of our study was to assess the potential added value of Stimulated Raman Histology (SRH) for the assessment of freshly excised central nervous system samples. We showed that SRH enabled a near-instant microscopic examination of various central nervous system samples without any tissue processing such as labelling, freezing nor sectioning. Following SRH imaging, we demonstrated that the samples could be readily recovered and reintroduced into a conventional pathology workflow including immunohistochemistry and genomic profiling to establish a definitive diagnosis.