Investigations on Ionizing Dose Deposition in Thin-Layered Devices: Sample-to-Sample Variability and Electronic Equilibrium Dependence - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Nuclear Science Année : 2023

Investigations on Ionizing Dose Deposition in Thin-Layered Devices: Sample-to-Sample Variability and Electronic Equilibrium Dependence

Marc Gaillardin
Damien Lambert
Sylvain Girard
Damien Aubert
Adriana Morana
Arnaud Meyer
Philippe Paillet
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hal-03978804 , version 1 (08-02-2023)

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Marc Gaillardin, Damien Lambert, Sylvain Girard, Damien Aubert, Gilles Assaillit, et al.. Investigations on Ionizing Dose Deposition in Thin-Layered Devices: Sample-to-Sample Variability and Electronic Equilibrium Dependence. IEEE Transactions on Nuclear Science, 2023, pp.1-1. ⟨10.1109/TNS.2023.3239950⟩. ⟨hal-03978804⟩
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