Correlations between DCR and PDP of SPAD integrated in a 28 nm FD-SOI CMOS Technology - Archive ouverte HAL Accéder directement au contenu
Poster De Conférence Année : 2023
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hal-03977945 , version 1 (07-02-2023)

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  • HAL Id : hal-03977945 , version 1

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Shaochen Gao Gao, Dylan Issartel, Mohammadreza Dolatpoor Lakeh, Fabien Mandorlo, Régis Orobtchouk, et al.. Correlations between DCR and PDP of SPAD integrated in a 28 nm FD-SOI CMOS Technology. 2023, International Image Sensor Workshop (IISW), Crieff, United Kingdom, 21-25 May, 2023, May 2023, Crieff, United Kingdom. 2023. ⟨hal-03977945⟩
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