Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Surface and Interface Analysis Année : 2010

Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques

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Matériaux

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hal-03968974 , version 1 (02-02-2023)

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J.-N. Audinot, Patrick Lévêque, Rony Bechara, Nicolas Leclerc, J. Guillot, et al.. Characterization of P3HT/PCBM bulk heterojunction photovoltaic devices using advanced secondary ion mass spectrometry techniques. Surface and Interface Analysis, 2010, 42 (6-7), pp.1010-1013. ⟨10.1002/sia.3359⟩. ⟨hal-03968974⟩

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