Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Applied Physics Année : 2018

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hal-03945159 , version 1 (18-01-2023)

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Franck Delmotte, Julia Meyer-Ilse, Farhad Salmassi, Regina Soufli, Catherine Burcklen, et al.. Soft x-ray optical constants of sputtered chromium thin films with improved accuracy in the L and M absorption edge regions. Journal of Applied Physics, 2018, 124 (3), pp.035107. ⟨10.1063/1.5027488⟩. ⟨hal-03945159⟩
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