Electric field profile measurement and modeling in multi-dielectrics for HVDC application - Archive ouverte HAL
Communication Dans Un Congrès Année : 2013
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hal-03943176 , version 1 (17-01-2023)

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  • HAL Id : hal-03943176 , version 1

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Thi Thu Nga Vu, Bertrand Vissouvanadin, Séverine Le Roy, M. Mammeri, I. Denizet, et al.. Electric field profile measurement and modeling in multi-dielectrics for HVDC application. ICSD : 11th IEEE International Conference on Solid Dielectrics, Bologna, Italy,, 2013, Bologna, Italy. ⟨hal-03943176⟩
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