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Article Dans Une Revue Progress In Electromagnetics Research M Année : 2023

Statistics of Two Indicators for Multilook Scattering Signals from Multilayered Structures with Slightly Rough Interfaces

Résumé

Within the framework of the first-order small perturbation method, we derive the statistics of the layered rough surface index and the normalized difference polarization index for three-dimensional layered structures with slightly rough interfaces illuminated by a monochromatic plane wave and for multilook returns. We establish closed-form expressions for the probability density function and cumulative distribution function. The first-and second-order moments are given by relation recurrences. We validate from Monte Carlo simulations the obtained theoretical formulas.
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hal-03938528 , version 1 (13-01-2023)

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Richard Dusséaux, Saddek Afifi. Statistics of Two Indicators for Multilook Scattering Signals from Multilayered Structures with Slightly Rough Interfaces. Progress In Electromagnetics Research M, 2023, 115, pp.11-20. ⟨10.2528/PIERM22092006⟩. ⟨hal-03938528⟩
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