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Article Dans Une Revue IEEE Transactions on Geoscience and Remote Sensing Année : 2022

N-Cluster Loss and Hard Sample Generative Deep Metric Learning for PolSAR Image Classification

Chen Yang
  • Fonction : Auteur
Biao Hou
Yue Hu
  • Fonction : Auteur
Bo Ren
Shuang Wang
Licheng Jiao

Résumé

Deep learning works normally in PolSAR image classification because the complex terrain scattering characteristic results in large intraclass differences and high interclass similarity. Deep metric learning (DML) aims to make the features keep a closer intraclass and a farther interclass distance. Therefore, we introduce DML and then propose an N-cluster generative adversarial net (N-cluster GAN) framework for PolSAR image classification. However, existing DML losses mainly focus on the relationship between individual samples in feature space. Hence, we propose N-cluster loss that pays more attention to the overall structure of all samples. Meanwhile, traditional hard negative sample mining methods occupy lots of computational resources. In addition, the hard level of the negative samples will affect the model’s performance. Therefore, we explore a new method based on a GAN framework to replace the sample mining. Positive N-cluster loss is added to the discriminator ( D ), and a negative one is added to the generator ( G ). In this way, D will possess better classification ability, and G can produce hard negative samples for D . Then, the hard level of the generated negative samples will change with the discrimination of D , which is appropriate for the proposed model. N-cluster loss can be directly calculated through the extracted features rather than redundant data preparation. The proposed model is verified on four PolSAR datasets from two aspects of the loss function and negative samples mining. Then, it achieves competitive performance compared with state-of-the-art algorithms.
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Dates et versions

hal-03932552 , version 1 (10-01-2023)

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Citer

Chen Yang, Biao Hou, Jocelyn Chanussot, Yue Hu, Bo Ren, et al.. N-Cluster Loss and Hard Sample Generative Deep Metric Learning for PolSAR Image Classification. IEEE Transactions on Geoscience and Remote Sensing, 2022, 60, pp.5210516. ⟨10.1109/TGRS.2021.3099840⟩. ⟨hal-03932552⟩
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