Characterization of interfacial chemical processes in Pd/Y multilayers using HAXPES induced by standing waves
Résumé
Pd/Y multilayers are high reflectance mirrors designed to work in the 7.5-11 nm wavelength range. Samples, prepared by magnetron sputtering, are deposited with or without B4C barrier layers located at the interfaces of Pd and Y layers to reduce interdiffusion [1], which is expected by calculating mixing enthalpy of Pd and Y. Details of the composition of the multilayers are revealed by hard x-ray photoemission spectroscopy under x-ray standing waves effect [2]. It consists in measuring the photoemission intensity from samples that perform an angular scan in the region corresponding to the multilayer period and the incident photon energy according to the Bragg law.
Domaines
Autre [cond-mat.other]
Origine : Fichiers produits par l'(les) auteur(s)