Two-dimensional carrier profiling on InP:Zn MOVPE epitaxially grown layers by Kelvin Probe Force Microscopy with associated modelling - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2022

Two-dimensional carrier profiling on InP:Zn MOVPE epitaxially grown layers by Kelvin Probe Force Microscopy with associated modelling

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hal-03878585 , version 1 (29-11-2022)

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  • HAL Id : hal-03878585 , version 1

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Mattia da Lisca, J Alvarez, J.P. Connolly, Karim Mekhazni, Nicolas Vaissiere, et al.. Two-dimensional carrier profiling on InP:Zn MOVPE epitaxially grown layers by Kelvin Probe Force Microscopy with associated modelling. 23rd international conference on non-contact atomic force microscopy (NCAFM2022), Aug 2022, Niemegen, Netherlands. ⟨hal-03878585⟩
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