Integrated metrology devices dedicated to transient Harman measurement of silicon nano-meshes - Archive ouverte HAL
Communication Dans Un Congrès Année : 2022

Integrated metrology devices dedicated to transient Harman measurement of silicon nano-meshes

Résumé

In thermoelectricity, silicon nanostructures represent an interesting alternative to conventional thermoelectric materials due to Si abundance, non-toxic nature and its compatibility with CMOS technology. Researchers have investigated methods to enhance the silicon figure of merit zT by increasing the σ/κ ratio; decreasing the thermal conductivity κ by (i) using nanometric structure such as thin membranes or nanowires, (ii) roughening, (iii) oxidization of the surface achieved relatively low value of κ.
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Dates et versions

hal-03870513 , version 1 (24-11-2022)

Identifiants

  • HAL Id : hal-03870513 , version 1

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Hafsa Ikzibane, Jon Canosa Diaz, Emmanuel Dubois, Jean-François Robillard. Integrated metrology devices dedicated to transient Harman measurement of silicon nano-meshes. Nanoscale and Microscale Heat Transfer VII - Eurotherm, May 2022, Palermo, Italy. ⟨hal-03870513⟩
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