A complete solid solution between GeO2 and SiO2 with the α-quartz structure: additional X-ray diffraction data from Ge1-x SixO2 flux-grown crystals - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of Solid State Chemistry Année : 2023

A complete solid solution between GeO2 and SiO2 with the α-quartz structure: additional X-ray diffraction data from Ge1-x SixO2 flux-grown crystals

Résumé

Millimeter-sized crystals of formula Ge 1−x Si x O 2, i.e. GeO 2 materials partially substituted by SiO 2 , were obtained for the first time both in the middle and the Si-rich parts of the GeO 2-SiO 2 composition domain (0.5 ≤ x ≤ 0.93) by spontaneous nucleation using the hightemperature flux method. The X-ray crystal diffraction (XRD) data at room temperature confirm the non-centrosymmetric α-quartz-type structure and the low level of defects for these as-grown materials. The silicon content in the Ge 1−x Si x O 2 crystals was determined by interpolation from the inter-tetrahedral bridging angle. The complete mutual solubility is confirmed between α-SiO 2 and α-GeO 2. The deviation from the regularity of the TO 4 tetrahedra (T = Si, Ge) decreases linearly when Ge is gradually replaced by Si.
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Dates et versions

hal-03830205 , version 1 (26-10-2022)

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Pascale Armand, Dominique Granier, Monique Tillard. A complete solid solution between GeO2 and SiO2 with the α-quartz structure: additional X-ray diffraction data from Ge1-x SixO2 flux-grown crystals. Journal of Solid State Chemistry, 2023, 317, pp.123658. ⟨10.1016/j.jssc.2022.123658⟩. ⟨hal-03830205⟩
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