Active Clamp Circuit for Online ON-State Voltage Measurement of High Voltage SiC MOSFETs Power Module - Archive ouverte HAL
Communication Dans Un Congrès Année : 2023

Active Clamp Circuit for Online ON-State Voltage Measurement of High Voltage SiC MOSFETs Power Module

Résumé

This paper deals with online measurement of degradation sensitive electrical parameters leading to a health monitoring approach for power module. The on-state resistance RDSON is a key aging indicator of silicon carbide MOSFETs. It can provide information on both chip and packaging degradation allowing more reliable power electronic converter. This on-state resistance can be determined using both the on-state current and voltage of the power semiconductor. This paper focuses on an on-state voltage measurement circuit for high power modules (up to 3.3 kV, 500A SiC module). A power module switching oscillation model is used to design and fine tune the proposed solution. Finally, the proposed circuit is successfully tested on a double pulse test for various module base plate temperatures and compared to data obtained with a static curve tracer Keysight B1505.
Fichier non déposé

Dates et versions

hal-03823731 , version 1 (21-10-2022)

Identifiants

  • HAL Id : hal-03823731 , version 1

Citer

Antoine Laspeyres, Anne-Sophie Descamps, Christophe Batard, Nicolas Ginot, Long Thanh Le, et al.. Active Clamp Circuit for Online ON-State Voltage Measurement of High Voltage SiC MOSFETs Power Module. IEEE Applied Power Electronics Conference, Mar 2023, ORLANDO, United States. paper ID 1061. ⟨hal-03823731⟩
157 Consultations
0 Téléchargements

Partager

More