Integrated Characterization Solutions for ICs and Devices Beyond 100 GHz - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2022

Integrated Characterization Solutions for ICs and Devices Beyond 100 GHz

Résumé

This paper presents an innovative integrated load-pull bench at 160 GHz. The proposed system, which is designed in a 55-nm BiCMOS technology, is tailored to deal with all of the measurement functions including signal generation, shaping, and magnitude and phase measurement. This system will allow precise characterization of Devices-Under-Test (DUTs) (i.e., circuits and/or devices) when integrated together with the DUT. In addition, the proposed system could also be envisioned as a System-on-Chip (SoC) that, when reported into an RF probe, could serve as a test bench for any integrated circuit.
Fichier non déposé

Dates et versions

hal-03796736 , version 1 (04-10-2022)

Identifiants

  • HAL Id : hal-03796736 , version 1
  • WOS : 000853268100047

Citer

Marc Margalef-Rovira, Issa Alaji, Haitham Ghanem, Guillaume Ducournau, Christophe Gaquière. Integrated Characterization Solutions for ICs and Devices Beyond 100 GHz. 27th European Test Symposium, ETS 2022, May 2022, Barcelone, Spain. Special Session 1 - RF 5G Test. ⟨hal-03796736⟩
22 Consultations
0 Téléchargements

Partager

Gmail Mastodon Facebook X LinkedIn More