Charges injection in thin layers by Atomic Force Microscopy : Influence of tip composition and geometry on injection processes - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Nanotechnology Année : 2016

Charges injection in thin layers by Atomic Force Microscopy : Influence of tip composition and geometry on injection processes

Fichier non déposé

Dates et versions

hal-03794337 , version 1 (03-10-2022)

Identifiants

  • HAL Id : hal-03794337 , version 1

Citer

Christina Villeneuve-Faure, Kremena Makasheva, Laurent Boudou, Gilbert Teyssedre. Charges injection in thin layers by Atomic Force Microscopy : Influence of tip composition and geometry on injection processes. Nanotechnology, 2016, 27, 245702 ; 10p. ⟨hal-03794337⟩
15 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More