Experimental cartographies of mechanical deformations induced by a dc electrical field in organic insulator films
Résumé
This article presents an improved version of the mechanical strain induced measurement technique using a new digital image treatment. It allows to improve the comprehension as well as the modeling of materials’s life by realizing real-time experimental cartographies of the induced mechanical deformation of a sample surface subjected to an electrical field. The results obtained for Poly(ethylene naphthalene 2,6-dicarboxylate) PEN semi-crystalline thin films show that the induced mechanical deformation is non uniform on the surface, some areas present higher levels of deformation. We assume that these weaker areas can be produced by defects within the sample or local ageing related to the space charge accumulation.