(Invited) Luminescence of Rare Earth Doped Si Based Nanofilms for LED and Photovoltaic Applications - Archive ouverte HAL
Communication Dans Un Congrès Année : 2020

(Invited) Luminescence of Rare Earth Doped Si Based Nanofilms for LED and Photovoltaic Applications

Hervé Rinnert

Résumé

Rare earth (RE) doped silicon host matrices have been largely investigated to produce their luminescence's at different wavelengths for many applications such as Light Emitting Diode (LED) or frequency conversion layer to improve Solar Cells (SCs) efficiency. To achieve such a goal, RE ions-doped silicon oxynitride-based (SiO x N y ) films have been deposited by reactive magnetron co-sputtering. A oxynitride host matrix allows a high RE ions incorporation while avoiding the clustering effect observed in silicon oxide host matrix. In a first step, two different RE, Tb 3+ and Ce 3+ , have been investigated. The Tb 3+ ions present intra 4f transitions, whereas the Ce 3+ ions have 4f-5d transitions. [1] These two different electronic configurations are investigated by means of luminescence spectroscopy. Indeed, the first step of this work is motivated by achieving an intense emission of Tb 3+ and Ce 3+ ions by optimizing the deposition parameters. The SiO x N y : RE layers were deposited on silicon substrates by using RF magnetron sputtering technique under N 2 reactive flow, with a typical thickness of 20-50 nm. A deep investigation is performed to obtain an intense Ce 3+ photoluminescence signal according to the Ce and N concentrations. Up to 6 at. % of Ce 3+ , no saturation of the PL intensity has been observed, demonstrating the absence of Ce clusters and/or silicate phase formation thanks to the nitrogen content. The influence of the nitrogen on current injection will be presented and the electroluminescence (EL) properties (I-V characteristic, EL spectra) will be analyzed. [2] In a second step, down-converter (DC) layers compatible with the silicon industry which absorb UV photons and convert them into IR ones at an energy just above the Si band gap, were developed, taking account these two donors Tb 3+ and Ce 3+ and as acceptor the Yb 3+ ion. Two different co-doping have been chosen i.e. Tb 3+ -Yb 3+ and Ce 3+ -Yb 3+ with the aim at obtaining an intense emission of the Yb 3+ at 980 nm (1.265 eV). Furthermore the excitation mechanisms of acceptor ions Yb 3+ will be discussed in both cases. [3, 4] At last, efficiency measurements with our DC layers on homemade and industrial Si-SCs have been carried out. [5] [1] C. Labbé, Y.T. An, G. Zatryb, X. Portier, A. Podhorodecki, P. Marie, C. Frilay, J. Cardin, F. Gourbilleau, Structural and emission properties of Tb 3+ -doped nitrogen-rich silicon oxynitride films, Nanotechnology, 28 (2017) 115710-115714. [2] F. Ehre, C. Labbé, C. Dufour, W. Jadwisienczak, J. Weimmerskirch-Aubatin, X. Portier, J.-L. Doualan, J. Cardin, A. Richard, D.C. Ingram, C. Labrugère, F. Gourbilleau, Nitrogen concentration effect on Ce doped SiOxNy emission: towards optimized Ce3+ for DEL application Nanoscale, 20 (2018) 4818-4830. [3] Y.-T. An, C. Labbé, M. Morales, F. Gourbilleau, Highly efficient infrared quantum cutting in Tb 3+ -Yb 3+ codoped silicon oxynitride for solar cell applications, Advanced Optical Materials, 1 (2013) 855-862. [4] L. Dumont, P. Benzo, J. Cardin, I.S. Yu, C. Labbé, P. Marie, C. Dufour, G. Zatryb, A. Podhorodecki, F. Gourbilleau, Down-shifting Si-based layer for Si solar applications, Solar Energy Materials and Solar Cells, 169 (2017) 132-144. [5] L. Dumont, J. Cardin, C. Labbé, C. Frilay, P.-M. Anglade, I.S. Yu, M. Vallet, P. Benzo, M. Carrada, D. Stiévenard, H. Mérabet, F. Gourbilleau, First Down Converter multilayers integration in an industrial Si solar cell process, Progress in Photovoltaics: Research and Applications, 27 (2018) 152-162.
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Dates et versions

hal-03792557 , version 1 (30-09-2022)

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Florian Ehre, Julien Cardin, Christian Dufour, Fabrice Gourbilleau, Xavier Portier, et al.. (Invited) Luminescence of Rare Earth Doped Si Based Nanofilms for LED and Photovoltaic Applications. 237th ECS Meeting with the 18th International Meeting on Chemical Sensors (IMCS 2020), May 2020, Montreal, Canada. pp.1064-1064, ⟨10.1149/ma2020-01161064mtgabs⟩. ⟨hal-03792557⟩
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