[Invited] Challenges to measure RF noise and intermodulation performances of mmW/THz devices
Résumé
Applications in millimetre wave range and terahertz frequencies keep on increasing. In this context, drastic challenges are faced at measurement level, in particular to extract noise performance and nonlinear properties of devices and circuits used to build the required systems. The aim of this talk is to provide an overview of these challenges, and to describe the solutions that we have developed to respond to them.
Domaines
Electronique
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LAEDC IEMN invited paper Francois Danneville-2.pdf (966.95 Ko)
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