A Technique for the in-situ Experimental Extraction of the Thermal Impedance of Power Devices - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Power Electronics Année : 2022

A Technique for the in-situ Experimental Extraction of the Thermal Impedance of Power Devices

Résumé

In this letter, an innovative technique is presented, which allows the experimental extraction of the thermal impedance (ZTH) of power devices operating in their application environment (in situ). Such a technique draws inspiration from the thermal characterization of RF transistors, and it solely involves measurements of electrical quantities, thus not requiring cold-plates or preliminary calibrations. To unambiguously validate it, the 'simulated experiments' strategy relying on electrothermal simulations was applied on a SiC-based multichip power module. It was demonstrated that the technique can be effectively adopted for the in-situ extraction the ZTH of any power device, regardless of the assembly in which it is embedded.1 Index terms-Electrothermal simulation, in-situ extraction, power devices, thermal impedance measurement2 .
Fichier principal
Vignette du fichier
Sco22_manuscript_camera-ready.pdf (409.78 Ko) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-03776377 , version 1 (10-11-2022)

Identifiants

Citer

Ciro Scognamillo, Sebastien Fregonese, Thomas Zimmer, Vincenzo Daalessandro, Antonio Pio Catalano. A Technique for the in-situ Experimental Extraction of the Thermal Impedance of Power Devices. IEEE Transactions on Power Electronics, 2022, 37 (10), pp.11511-11515. ⟨10.1109/TPEL.2022.3174617⟩. ⟨hal-03776377⟩
14 Consultations
108 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More