A Technique for the in-situ Experimental Extraction of the Thermal Impedance of Power Devices
Résumé
In this letter, an innovative technique is presented, which allows the experimental extraction of the thermal impedance (ZTH) of power devices operating in their application environment (in situ). Such a technique draws inspiration from the thermal characterization of RF transistors, and it solely involves measurements of electrical quantities, thus not requiring cold-plates or preliminary calibrations. To unambiguously validate it, the 'simulated experiments' strategy relying on electrothermal simulations was applied on a SiC-based multichip power module. It was demonstrated that the technique can be effectively adopted for the in-situ extraction the ZTH of any power device, regardless of the assembly in which it is embedded.1 Index terms-Electrothermal simulation, in-situ extraction, power devices, thermal impedance measurement2 .
Domaines
Sciences de l'ingénieur [physics]
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