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Article Dans Une Revue Applied Physics Letters Année : 2017

Relaxation mechanisms in a gold thin film on a compliant substrate as revealed by X-ray diffraction

Pierre Godard
Pierre-Olivier Renault

Résumé

The fact that the polymeric substrate does not relax after a load jump allows realizing an original relaxation experiment of a metallic thin film. Thanks to the combination of two strain probes done at different scales, namely, X-ray synchrotron diffraction and digital image correlation techniques, the apparent activation volumes are monitored and their values help to capture leading deformation mechanisms in thin films. Such experiments have been performed on a nanocrystalline gold thin film, and deformation mechanisms involved during a biaxial straining have been distinguished between different texture components.
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Dates et versions

hal-03662120 , version 1 (09-05-2022)

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Pierre Godard, Pierre-Olivier Renault, Damien Faurie, Dominique Thiaudière. Relaxation mechanisms in a gold thin film on a compliant substrate as revealed by X-ray diffraction. Applied Physics Letters, 2017, 110 (21), pp.211901. ⟨10.1063/1.4984135⟩. ⟨hal-03662120⟩
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