Condition monitoring and evaluation of Ron degradation during power cycling of SiC-Mosfets power modules - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2022
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hal-03656145 , version 1 (01-05-2022)

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Ali Ibrahim, Zoubir Khatir, Mounira Bouarroudj-Berkani. Condition monitoring and evaluation of Ron degradation during power cycling of SiC-Mosfets power modules. International Conference on integrated Power Electronics Systems (CIPS), Mar 2022, Berlin, Germany. ⟨hal-03656145⟩
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