Numerical and experimental analysis of the static characteristics and noise in ungated recessed MESFET structures - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Solid-State Electronics Année : 1996

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hal-03612845 , version 1 (18-03-2022)

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J. Mateos, T. González, D. Pardo, P. Tadyszak, Francois Danneville, et al.. Numerical and experimental analysis of the static characteristics and noise in ungated recessed MESFET structures. Solid-State Electronics, 1996, 39 (11), pp.1629-1636. ⟨10.1016/0038-1101(96)00083-4⟩. ⟨hal-03612845⟩
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