A New Simple Analytical Method for a Highly Accurate Determination of the Optical Parameters of a Slab from Transmittance Data
Résumé
To date, determining with high accuracy the optical parameters (extinction coefficient k and refractive index n) of a slab from the sole transmittance data requires an inverse method based on numerical iteration procedures. In this paper, we propose a new inverse analytical method of extracting ( k, n) without numerical iterative processes. The high accuracy of this new inverse method is assessed, and as an application example, the optical parameters of CaF 2 and Si substrates are determined in the IR spectral range of 4–8 µm.
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