Critical assessment of machine-learned repulsive potentials for the density functional based tight-binding method: A case study for pure silicon - Archive ouverte HAL Access content directly
Journal Articles The Journal of Chemical Physics Year : 2022

Critical assessment of machine-learned repulsive potentials for the density functional based tight-binding method: A case study for pure silicon

Abstract

We investigate the feasibility of improving the semi-empirical density functional based tight-binding method through a general and transferable many-body repulsive potential for pure silicon using a common machine-learning framework. Atomic environments using atom centered symmetry functions fed into flexible neural-networks allow us to overcome the limited pair potentials used until now with the ability to train simultaneously on a large variety of systems. We achieve an improvement on bulk systems with good performance on energetic, vibrational, and structural properties. Contrarily, there are difficulties for clusters due to surface effects. To deepen the discussion, we also put these results into perspective with two fully machine-learned numerical potentials for silicon from the literature. This allows us to identify both the transferability of such approaches together with the impact of narrowing the role of machine-learning models to reproduce only a part of the total energy.

Dates and versions

hal-03586615 , version 1 (24-02-2022)

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D. Bissuel, T. Albaret, Thomas Niehaus. Critical assessment of machine-learned repulsive potentials for the density functional based tight-binding method: A case study for pure silicon. The Journal of Chemical Physics, 2022, 156 (6), pp.064101. ⟨10.1063/5.0081159⟩. ⟨hal-03586615⟩
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