Load-Pull Setup Development at 185 GHz for On-Wafer Characterization of SiGe HBT in BiCMOS 55 nm Technology
Caroline Maye
(1, 2)
,
Sylvie Lepilliet
(3, 1)
,
Etienne Okada
(1, 3)
,
Marc Margalef-Rovira
(1, 2)
,
Issa Alaji
(1, 2)
,
Daniel Gloria
(4)
,
Guillaume Ducournau
(1, 5)
,
Christophe Gaquière
(1, 2)
Caroline Maye
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- Fonction : Auteur correspondant
- PersonId : 1121639
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Sylvie Lepilliet
- Fonction : Auteur
- PersonId : 745478
- IdHAL : sylvie-lepilliet
Etienne Okada
- Fonction : Auteur
- PersonId : 745489
- IdHAL : etienne-okada
Marc Margalef-Rovira
- Fonction : Auteur
- PersonId : 796577
- ORCID : 0000-0002-6049-7915
Guillaume Ducournau
- Fonction : Auteur
- PersonId : 745611
- IdHAL : guillaume-ducournau
- ORCID : 0000-0002-9171-4767
- IdRef : 090868382
Christophe Gaquière
- Fonction : Auteur
- PersonId : 746853
- IdHAL : christophe-gaquiere
- ORCID : 0000-0003-3082-2489
- IdRef : 059765615
Résumé
This article aims to discuss challenges and performances of a passive load-pull test bench dedicated to the G-band frequencies. The first task of this work is the development of the setup to perform high power generation, impedance generation, and high-power dynamic of measurement. The solution proposed is the association of an external power system of source and detectors, with an integrated synthesizer of impedance. The proposed system requires several analysis steps in order to be validated. On the other hand, special care is dedicated to the calibration of the scalar measurement in the millimeter-wave frequency range. Then, due to the unknown phase at the input and output of the device under test (DUT), scalar measurement can lead to high inaccuracy. Hence, an adaptive calibration is proposed and applied to the measurement of a bipolar transistor at 185 GHz. We highlight the effect of the missing phase information on the accuracy of measurement. Results of the measurement are discussed.
Domaines
Sciences de l'ingénieur [physics]Format du dépôt | Notice |
---|---|
Type de dépôt | Article dans une revue |
Titre |
en
Load-Pull Setup Development at 185 GHz for On-Wafer Characterization of SiGe HBT in BiCMOS 55 nm Technology
|
Résumé |
en
This article aims to discuss challenges and performances of a passive load-pull test bench dedicated to the G-band frequencies. The first task of this work is the development of the setup to perform high power generation, impedance generation, and high-power dynamic of measurement. The solution proposed is the association of an external power system of source and detectors, with an integrated synthesizer of impedance. The proposed system requires several analysis steps in order to be validated. On the other hand, special care is dedicated to the calibration of the scalar measurement in the millimeter-wave frequency range. Then, due to the unknown phase at the input and output of the device under test (DUT), scalar measurement can lead to high inaccuracy. Hence, an adaptive calibration is proposed and applied to the measurement of a bipolar transistor at 185 GHz. We highlight the effect of the missing phase information on the accuracy of measurement. Results of the measurement are discussed.
|
Auteur(s) |
Caroline Maye
1, 2
, Sylvie Lepilliet
3, 1
, Etienne Okada
1, 3
, Marc Margalef-Rovira
1, 2
, Issa Alaji
1, 2
, Daniel Gloria
4
, Guillaume Ducournau
1, 5
, Christophe Gaquière
1, 2
1
IEMN -
Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520
( 1066983 )
- [Univ. Lille, CNRS, Centrale Lille Institut, Junia, Univ. Polytechnique Hauts-de-France] ––
Laboratoire Central – Cité Scientifique – Avenue Poincaré – CS 60069 – 59652 VILLENEUVE D’ASCQ CEDEX
- France
2
PUISSANCE - IEMN -
Puissance - IEMN
( 1067481 )
- Groupe Puissance - (Microwave Power Devices group) - IEMN UMR8520
- France
3
PCMP - IEMN -
Plateforme de Caractérisation Multi-Physiques - IEMN
( 1067502 )
- France
4
ST-CROLLES -
STMicroelectronics [Crolles]
( 23639 )
- 850 rue Jean Monnet BP 16 38926 Crolles
- France
5
PHOTONIQUE THZ - IEMN -
Photonique THz - IEMN
( 1067488 )
- Groupe Photonique THz - IEMN UMR8520 - (Terahertz Photonics)
- France
|
Nom de la revue |
|
Date de publication |
2022-01
|
Volume |
70
|
Numéro |
1
|
Page/Identifiant |
pp 444-452
|
Langue du document |
Anglais
|
Vulgarisation |
Non
|
Comité de lecture |
Oui
|
Audience |
Internationale
|
Date de publication électronique |
2021-09-22
|
Commentaire |
This article is an expanded version from the 2020 International Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits, Cardiff, 16-17 July 2020.
|
Référence interne |
|
Projet(s) Européen(s) |
|
Domaine(s) |
|
Collaboration/Projet |
|
Financement |
|
Mots-clés |
en
Tuners, Impedance, Radio frequency, Power measurement, Frequency measurement, Power generation, Calibration
|
DOI | 10.1109/TMTT.2021.3111170 |
UT key WOS | 000732676700001 |
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