<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-03485119</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-17T05:13:34+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Understanding the Thermal Time Constants of GaN HEMTs through Model Order Reduction Technique</title>
            <author role="aut">
              <persName>
                <forename type="first">Anass</forename>
                <surname>Jakani</surname>
              </persName>
              <idno type="idhal" notation="numeric">802979</idno>
              <idno type="halauthorid" notation="string">1819565-802979</idno>
              <idno type="ORCID">https://orcid.org/0000-0002-6585-5398</idno>
              <affiliation ref="#struct-444306"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Raphaël</forename>
                <surname>Sommet</surname>
              </persName>
              <email type="md5">19f895c0010150e69771838a9cfb519b</email>
              <email type="domain">xlim.fr</email>
              <idno type="idhal" notation="string">raphael-sommet</idno>
              <idno type="idhal" notation="numeric">6533</idno>
              <idno type="halauthorid" notation="string">14209-6533</idno>
              <idno type="ORCID">https://orcid.org/0000-0002-4170-1781</idno>
              <idno type="IDREF">https://www.idref.fr/088662799</idno>
              <idno type="VIAF">https://viaf.org/viaf/198793674</idno>
              <idno type="ISNI">http://isni.org/isni/0000000357708766</idno>
              <affiliation ref="#struct-444306"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Frédérique</forename>
                <surname>Simbélie</surname>
              </persName>
              <idno type="halauthorid">2373340-0</idno>
              <affiliation ref="#struct-237907"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Jean-Christophe</forename>
                <surname>Nallatamby</surname>
              </persName>
              <email type="md5">a57b68777a9a69a660c6904db357fac7</email>
              <email type="domain">xlim.fr</email>
              <idno type="idhal" notation="string">jean-christophe-nallatamby</idno>
              <idno type="idhal" notation="numeric">6541</idno>
              <idno type="halauthorid" notation="string">14231-6541</idno>
              <idno type="ORCID">https://orcid.org/0000-0002-5082-3932</idno>
              <idno type="IDREF">https://www.idref.fr/102136181</idno>
              <idno type="VIAF">https://viaf.org/viaf/215039877</idno>
              <idno type="ISNI">http://isni.org/isni/0000000139090689</idno>
              <affiliation ref="#struct-444306"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Raphael</forename>
                <surname>Sommet</surname>
              </persName>
              <email type="md5">19f895c0010150e69771838a9cfb519b</email>
              <email type="domain">xlim.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2022-10-10 16:09:07</date>
              <date type="whenModified">2024-09-06 13:34:04</date>
              <date type="whenReleased">2022-10-11 07:52:17</date>
              <date type="whenProduced">2021-12</date>
              <date type="whenEndEmbargoed">2022-10-10</date>
              <ref type="file" target="https://hal.science/hal-03485119v1/document">
                <date notBefore="2022-10-10"/>
              </ref>
              <ref type="file" subtype="greenPublisher" n="1" target="https://hal.science/hal-03485119v1/file/Understanding%20the%20Thermal%20Time%20Constant...%20Reduction%20Technique%20_%20Enhanced%20Reader.pdf" id="file-3808605-3328505">
                <date notBefore="2022-10-10"/>
              </ref>
              <ref type="externalLink" target="https://www.mdpi.com/2079-9292/10/24/3138/pdf"/>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="133437">
                <persName>
                  <forename>Raphael</forename>
                  <surname>Sommet</surname>
                </persName>
                <email type="md5">19f895c0010150e69771838a9cfb519b</email>
                <email type="domain">xlim.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-03485119</idno>
            <idno type="halUri">https://hal.science/hal-03485119</idno>
            <idno type="halBibtex">jakani:hal-03485119</idno>
            <idno type="halRefHtml">&lt;i&gt;Electronics&lt;/i&gt;, 2021, 10 (24), pp.3138. &lt;a target="_blank" href="https://dx.doi.org/10.3390/electronics10243138"&gt;&amp;#x27E8;10.3390/electronics10243138&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">Electronics, 2021, 10 (24), pp.3138. &amp;#x27E8;10.3390/electronics10243138&amp;#x27E9;</idno>
            <availability status="restricted">
              <licence target="https://about.hal.science/hal-authorisation-v1/">HAL Authorization<ref corresp="#file-3808605-3328505"/></licence>
            </availability>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="UNILIM">Université de Limoges</idno>
            <idno type="stamp" n="CNRS">CNRS - Centre national de la recherche scientifique</idno>
            <idno type="stamp" n="XLIM" corresp="UNILIM">XLIM</idno>
            <idno type="stamp" n="XLIM-SRF" corresp="XLIM">Systèmes RF</idno>
            <idno type="stamp" n="TEST-HALCNRS">Collection test HAL CNRS</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Understanding the Thermal Time Constants of GaN HEMTs through Model Order Reduction Technique</title>
                <author role="aut">
                  <persName>
                    <forename type="first">Anass</forename>
                    <surname>Jakani</surname>
                  </persName>
                  <idno type="idhal" notation="numeric">802979</idno>
                  <idno type="halauthorid" notation="string">1819565-802979</idno>
                  <idno type="ORCID">https://orcid.org/0000-0002-6585-5398</idno>
                  <affiliation ref="#struct-444306"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Raphaël</forename>
                    <surname>Sommet</surname>
                  </persName>
                  <email type="md5">19f895c0010150e69771838a9cfb519b</email>
                  <email type="domain">xlim.fr</email>
                  <idno type="idhal" notation="string">raphael-sommet</idno>
                  <idno type="idhal" notation="numeric">6533</idno>
                  <idno type="halauthorid" notation="string">14209-6533</idno>
                  <idno type="ORCID">https://orcid.org/0000-0002-4170-1781</idno>
                  <idno type="IDREF">https://www.idref.fr/088662799</idno>
                  <idno type="VIAF">https://viaf.org/viaf/198793674</idno>
                  <idno type="ISNI">http://isni.org/isni/0000000357708766</idno>
                  <affiliation ref="#struct-444306"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Frédérique</forename>
                    <surname>Simbélie</surname>
                  </persName>
                  <idno type="halauthorid">2373340-0</idno>
                  <affiliation ref="#struct-237907"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Jean-Christophe</forename>
                    <surname>Nallatamby</surname>
                  </persName>
                  <email type="md5">a57b68777a9a69a660c6904db357fac7</email>
                  <email type="domain">xlim.fr</email>
                  <idno type="idhal" notation="string">jean-christophe-nallatamby</idno>
                  <idno type="idhal" notation="numeric">6541</idno>
                  <idno type="halauthorid" notation="string">14231-6541</idno>
                  <idno type="ORCID">https://orcid.org/0000-0002-5082-3932</idno>
                  <idno type="IDREF">https://www.idref.fr/102136181</idno>
                  <idno type="VIAF">https://viaf.org/viaf/215039877</idno>
                  <idno type="ISNI">http://isni.org/isni/0000000139090689</idno>
                  <affiliation ref="#struct-444306"/>
                </author>
              </analytic>
              <monogr>
                <idno type="halJournalId" status="VALID">109186</idno>
                <idno type="issn">2079-9292</idno>
                <title level="j">Electronics</title>
                <imprint>
                  <publisher>MDPI</publisher>
                  <biblScope unit="volume">10</biblScope>
                  <biblScope unit="issue">24</biblScope>
                  <biblScope unit="pp">3138</biblScope>
                  <date type="datePub">2021-12</date>
                </imprint>
              </monogr>
              <idno type="doi">10.3390/electronics10243138</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <classCode scheme="halDomain" n="spi.tron">Engineering Sciences [physics]/Electronics</classCode>
              <classCode scheme="halTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halOldTypology" n="ART">Journal articles</classCode>
              <classCode scheme="halTreeTypology" n="ART">Journal articles</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>This paper described a comparison between a numerical Finite Element Analysis (FEA) and an analytical approach in order to extract the thermal time constants and the thermal resistances of simple but realistic structures. Understanding the complex contribution of multidimensional thermal spreading, the effect of multiple layers, and the correlation with the heat source length is mandatory due to the severe mismatch of thermal expansion in different epitaxial layers and high operating temperatures. This is especially true on GaN HEMT (High Electron Mobility Transistor) with the continuous decrease of the gate length and the increase of the power density. Moreover, in this paper, we extracted the time constants with a Model Order Reduction (MOR) technique based on the Ritz vector approach with inputs coming from the FE matrices. It was found that the time constants obtained by an analytical solution and a model order extraction from FEA were exactly the same. This result validated the idea that our MOR technique provides the real time constants and resistances for our device structures and in this case unified the analytical world with the numerical one.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="researchteam" xml:id="struct-444306" status="OLD">
          <orgName>Systèmes RF</orgName>
          <orgName type="acronym">XLIM-SRF</orgName>
          <date type="start">2016-01-01</date>
          <date type="end">2021-12-31</date>
          <desc>
            <address>
              <addrLine>XLIM - 123, avenue Albert Thomas - 87060 LIMOGES CEDEX</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.xlim.fr/</ref>
          </desc>
          <listRelation>
            <relation name="SRF" active="#struct-182467" type="direct"/>
            <relation active="#struct-5928" type="indirect"/>
            <relation name="UMR7252" active="#struct-441569" type="indirect"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-237907" status="VALID">
          <orgName>AMCAD Engineering</orgName>
          <desc>
            <address>
              <addrLine>Bâtiment Galiléo, 20 rue d'Atlantis, 87068 Limoges</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.amcad-engineering.com</ref>
          </desc>
        </org>
        <org type="laboratory" xml:id="struct-182467" status="OLD">
          <idno type="IdRef">128007052</idno>
          <idno type="ISNI">0000000405977726</idno>
          <idno type="RNSR">201220195D</idno>
          <idno type="ROR">https://ror.org/00f7srh09</idno>
          <orgName>XLIM</orgName>
          <orgName type="acronym">XLIM</orgName>
          <date type="start">2012-01-01</date>
          <date type="end">2021-12-31</date>
          <desc>
            <address>
              <addrLine>123 Avenue Albert THOMAS 87060 LIMOGES CEDEX</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.xlim.fr</ref>
          </desc>
          <listRelation>
            <relation active="#struct-5928" type="direct"/>
            <relation name="UMR7252" active="#struct-441569" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-5928" status="VALID">
          <idno type="IdRef">026403315</idno>
          <idno type="ISNI">0000000121654861</idno>
          <idno type="ROR">https://ror.org/02cp04407</idno>
          <orgName>Université de Limoges</orgName>
          <orgName type="acronym">UNILIM</orgName>
          <date type="start">1968-10-01</date>
          <desc>
            <address>
              <addrLine>33 rue François Mitterrand BP23204 87032 Limoges</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.unilim.fr</ref>
          </desc>
        </org>
        <org type="regroupinstitution" xml:id="struct-441569" status="VALID">
          <idno type="IdRef">02636817X</idno>
          <idno type="ISNI">0000000122597504</idno>
          <idno type="ROR">https://ror.org/02feahw73</idno>
          <orgName>Centre National de la Recherche Scientifique</orgName>
          <orgName type="acronym">CNRS</orgName>
          <date type="start">1939-10-19</date>
          <desc>
            <address>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.cnrs.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>