Solid and Non-Solid Dielectric Material Characterization for Millimeter and Sub-Millimeter Wave Applications - Archive ouverte HAL
Communication Dans Un Congrès Année : 2021

Solid and Non-Solid Dielectric Material Characterization for Millimeter and Sub-Millimeter Wave Applications

Daniel Bourreau
Alain Peden

Résumé

An accurate quasi-optical S-parameter measurement method implemented in the normalized frequency bands Ka, W and J is presented in this paper. Permittivity extraction of various solid or non-solid dielectric materials is performed using the 4 S-parameters without time domain gating nor filtering. The procedure is validated through the comparison between the simulated and measured 4 S-parameters in magnitude and phase. Results are given for the Rexolite over a wide frequency span from the Ka to J band while some non-solid materials were characterized in the W band. Moreover, effects of rain flow on a dielectric slab were investigated for automotive radar applications in the W band and preliminary results are given.
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hal-03421606 , version 1 (05-07-2023)

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Daniel Bourreau, Alain Peden. Solid and Non-Solid Dielectric Material Characterization for Millimeter and Sub-Millimeter Wave Applications. EuMC 2020: 50th European Microwave Conference, Jan 2021, Utrecht, Netherlands. pp.909-912, ⟨10.23919/EuMC48046.2021.9338045⟩. ⟨hal-03421606⟩
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