Impact of radiation-induced soft error on embedded cryptography algorithms - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2021

Impact of radiation-induced soft error on embedded cryptography algorithms

Fichier non déposé

Dates et versions

hal-03375885 , version 1 (13-10-2021)

Licence

Paternité - Pas d'utilisation commerciale

Identifiants

  • HAL Id : hal-03375885 , version 1

Citer

Vitor Bandeira, Jack Sampford, Rafael Garibotti, Matheus Garay Trindade, Rodrigo Possamai Bastos, et al.. Impact of radiation-induced soft error on embedded cryptography algorithms. European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2021), Oct 2021, Bordeaux, France. ⟨hal-03375885⟩

Collections

UGA CNRS TIMA
29 Consultations
0 Téléchargements

Partager

Gmail Facebook X LinkedIn More