Influence of Interface on the Charge Carrier Mobility of La2Ti2O7 Layered Perovskite Thin Films Measured by the Time-of-Flight Method
Résumé
We report the electrical characterizations of La2Ti2O7 thin films synthetized by pulsed laser deposition. We observe a significant change in I–V curve in the presence of UV light. The conduction mechanism can be described by two regimes: ohmic at low voltage and space charge limited conduction for higher voltage. Finally, for the first time to our knowledge, the charge carrier mobility of this material is studied; we use the time-of-flight method to investigate this property. We explain the evolution of the carrier mobility with the applied voltage by the presence of a depletion layer between the film and the gold contact, which affects the measurements.
Fichier principal
Influence of Interface on the Charge Carrier Mobility of Lasub2Ti2O7 Layered Perovskite Thin Films Measured by the TimeofFlight Method.pdf (1.08 Mo)
Télécharger le fichier
| Origine | Fichiers produits par l'(les) auteur(s) |
|---|