Influence of Interface on the Charge Carrier Mobility of La<sub>2</sub>Ti<sub>2</sub>O<sub>7</sub> Layered Perovskite Thin Films Measured by the Time-of-Flight Method - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue ACS Applied Electronic Materials Année : 2021

Influence of Interface on the Charge Carrier Mobility of La2Ti2O7 Layered Perovskite Thin Films Measured by the Time-of-Flight Method

Résumé

We report the electrical characterizations of La2Ti2O7 thin films synthetized by pulsed laser deposition. We observe a significant change in I–V curve in the presence of UV light. The conduction mechanism can be described by two regimes: ohmic at low voltage and space charge limited conduction for higher voltage. Finally, for the first time to our knowledge, the charge carrier mobility of this material is studied; we use the time-of-flight method to investigate this property. We explain the evolution of the carrier mobility with the applied voltage by the presence of a depletion layer between the film and the gold contact, which affects the measurements.
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hal-03337210 , version 1 (20-11-2023)

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Sébastien Leroy, Redouane Douali, Christian Legrand, Freddy Krasinski, Florent Blanchard, et al.. Influence of Interface on the Charge Carrier Mobility of La2Ti2O7 Layered Perovskite Thin Films Measured by the Time-of-Flight Method. ACS Applied Electronic Materials, 2021, 3 (7), pp.3167-3176. ⟨10.1021/acsaelm.1c00365⟩. ⟨hal-03337210⟩
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