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Communication Dans Un Congrès Année : 2014

On-wafer differential noise figure measurement without couplers on a vector network analyzer

Résumé

This papers presents a measurement technique for the noise figure of on-wafer differential amplifiers using 4-port network analyzers. The approach is based on the determination of the correlation of output noise waves in terms of the 4-port S-parameters and of the output noise powers. The measurement setup is simple as it does not require any hybrid coupler or calibrated noise source. Measurement results of an on-wafer differential LNA demonstrate the validity of the new technique.
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Dates et versions

hal-03272692 , version 1 (28-06-2021)

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Yogadissen Andee, Alexandre Siligaris, Francois Graux, Francois Danneville. On-wafer differential noise figure measurement without couplers on a vector network analyzer. 84th ARFTG Microwave Measurement Conference, Dec 2014, Boulder, United States. ⟨10.1109/ARFTG.2014.7013403⟩. ⟨hal-03272692⟩
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