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Journal Articles Journal of Microscopy Year : 2000

Secondary ion mass spectrometry imaging of the fixation of 15N-labelled NO in pollen grains

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hal-03264631 , version 1 (18-06-2021)

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F. Lhuissier, F. Lefebvre, M. Demarty, David Gibouin, M. Thellier, et al.. Secondary ion mass spectrometry imaging of the fixation of 15N-labelled NO in pollen grains. Journal of Microscopy, 2000, 198 (2), pp.108-115. ⟨10.1046/j.1365-2818.2000.00690.x⟩. ⟨hal-03264631⟩
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