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Article Dans Une Revue Physical Review Research Année : 2021

High resolution strain measurements in highly disordered materials

Résumé

The ability to measure small deformations or strains is useful for understanding many aspects of materials. Here, an alternate analysis of speckle x-ray diffraction peaks is presented in which the systematic shifts of the speckles are analyzed allowing for strain (or flow) patterns to be inferred. This speckle tracking technique measures strain patterns with an accuracy similar to x-ray single crystal measurements but in amorphous or highly disordered materials.
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Dates et versions

hal-03255030 , version 1 (09-06-2021)

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Mark Sutton, Julien R M Lhermitte, Françoise Ehrburger-Dolle, Frédéric Livet. High resolution strain measurements in highly disordered materials. Physical Review Research, 2021, 3, ⟨10.1103/physrevresearch.3.013119⟩. ⟨hal-03255030⟩
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