Atomic Structures of Silicene Layers Grown on Ag(111): Scanning Tunneling Microscopy and Noncontact Atomic Force Microscopy Observations - Archive ouverte HAL
Journal Articles Scientific Reports Year : 2013

Atomic Structures of Silicene Layers Grown on Ag(111): Scanning Tunneling Microscopy and Noncontact Atomic Force Microscopy Observations

Abstract

Silicene, the considered equivalent of graphene for silicon, has been recently synthesized on Ag(111) surfaces. Following the tremendous success of graphene, silicene might further widen the horizon of two-dimensional materials with new allotropes artificially created. Due to stronger spin-orbit coupling, lower group symmetry and different chemistry compared to graphene, silicene presents many new interesting features. Here, we focus on very important aspects of silicene layers on Ag(111): First, we present scanning tunneling microscopy (STM) and non-contact Atomic Force Microscopy (nc-AFM) observations of the major structures of single layer and bi-layer silicene in epitaxy with Ag(111). For the (3 3 3) reconstructed first silicene layer nc-AFM represents the same lateral arrangement of silicene atoms as STM and therefore provides a timely experimental confirmation of the current picture of the atomic silicene structure. Furthermore, both nc-AFM and STM give a unifying interpretation of the second layer (!3 3 !3)R 6 306 structure. Finally, we give support to the conjectured possible existence of less stable, ,2% stressed, (!7 3 !7)R 6 19.16 rotated silicene domains in the first layer.
Fichier principal
Vignette du fichier
srep02399.pdf (3.13 Mo) Télécharger le fichier
Origin Publisher files allowed on an open archive

Dates and versions

hal-03246059 , version 1 (02-06-2021)

Licence

Identifiers

Cite

Andrea Resta, Thomas Leoni, Clemens Barth, Alain Ranguis, Conrad Becker, et al.. Atomic Structures of Silicene Layers Grown on Ag(111): Scanning Tunneling Microscopy and Noncontact Atomic Force Microscopy Observations. Scientific Reports, 2013, 3, ⟨10.1038/srep02399⟩. ⟨hal-03246059⟩
52 View
36 Download

Altmetric

Share

More