Coupled Time Resolved and High Frequency Modulated Photoluminescence probing surface passivation of highly doped ntype InP samples
Résumé
Electronic passivation of III-V surfaces is essential for applications in optoelectronic devices. A key aspect is the measurement of the surface recombination properties which can be done by various techniques including transient photoluminescence (TRPL) or luminescence quantum yield. We use a complementary approach combining TRPL and High Frequency Modulated Photoluminescence.
Domaines
Physique [physics]
Origine : Fichiers produits par l'(les) auteur(s)