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Article Dans Une Revue Journal of Applied Physics Année : 2021

Coupled Time Resolved and High Frequency Modulated Photoluminescence probing surface passivation of highly doped ntype InP samples

Résumé

Electronic passivation of III-V surfaces is essential for applications in optoelectronic devices. A key aspect is the measurement of the surface recombination properties which can be done by various techniques including transient photoluminescence (TRPL) or luminescence quantum yield. We use a complementary approach combining TRPL and High Frequency Modulated Photoluminescence.
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Dates et versions

hal-03244613 , version 1 (01-06-2021)

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Wei Zhao, Baptiste Bérenguier, Cendra Patie Rakotoarimanana, Anne-Marie Goncalves, Arnaud Etcheberry, et al.. Coupled Time Resolved and High Frequency Modulated Photoluminescence probing surface passivation of highly doped ntype InP samples. Journal of Applied Physics, inPress, 129 (21), pp.215305. ⟨10.1063/5.0033122⟩. ⟨hal-03244613⟩
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