Application of ultrafast optical interferometry for opto- acousto-optical depth-profiling of materials - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2020

Application of ultrafast optical interferometry for opto- acousto-optical depth-profiling of materials

Résumé

Photoacoustic methods of non-destructive testing and evaluation (NDTE) of materials with the use of lasers are of great interest due to their contactless nature. One of these methods is time-domain Brillouin scattering (TDBS) [1] where the monitoring of the acoustic pulse propagation in optically transparent media can provide a depth profile of the sample material inhomogeneity with nanometers spatial resolution [2, 3]. The information on the spatial profiles of the sound velocity, the optical refractive index [2, 4] and of the photo-elastic constant [3] can be revealed. In a case where the amplitude and the frequency of the oscillating part of the transient reflectivity signal are varying at the same characteristic times, their precise separation by measuring only the real part of the transient optical reflectivity signal is impossible, thereby, forbidding the independent depth profiling of different material parameters. For the independent depth profiling of several material parameters both real and imaginary parts of the optical reflectivity should be measured experimentally [5]. This is possible if the optical interferometry is applied. Basing on the advances in the application of the ultrafast optical interferometry [6], we have constructed an experimental setup that will lead to the first application of the ultrafast optical interferometry for the opto- acousto-optical depth profiling of materials. At first, the setup will be applied for the depth profiling of the materials with the known spatially inhomogeneous chemical composition. [1] H. T. Graham et al., IEEE J. Quantum Electron. 25, 2562 (1989). [2] C. Mechri et al., Appl. Phys. Lett. 95, 091907 (2009). [3] A. Steigerwald et al., Appl. Phys. Lett. 94, 111910 (2009). [4] A. M. Lomonosov et al., ACS Nano 6, 1410 (2012). [5] V. Gusev et al., J. Appl. Phys. 110, 124908 (2011). [6] O. Matsuda et al., J. Opt. Soc. Am. B, 30, 1911(2013).
Fichier non déposé

Dates et versions

hal-03240237 , version 1 (28-05-2021)

Identifiants

Citer

Artem Husiev, Nikolay Chigarev, Samuel Raetz, Vincent Tournat, Osamu Matsuda, et al.. Application of ultrafast optical interferometry for opto- acousto-optical depth-profiling of materials. Forum Acusticum, Dec 2020, Lyon, France. pp.1817-1817, ⟨10.48465/fa.2020.0274⟩. ⟨hal-03240237⟩
43 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More