Near-field scanning microwave microscope for subsurface non-destructive characterization - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2015

Near-field scanning microwave microscope for subsurface non-destructive characterization

Résumé

We report a nondestructive testing system based on near-field scanning microwave microscopy. The instrumentation is built up with a vector network analyzer, a fully automated tuning matching network and an evanescent microwave probe. The system can perform microwave images in the frequency band 0.1-20 GHz on scanning ranges of 25x25 cm(2). The spatial resolution is experimentally verified by investigating imaging of metal slots. A lumped element model is built to describe the probe-sample interaction.
Fichier non déposé

Dates et versions

hal-03224667 , version 1 (11-05-2021)

Identifiants

Citer

Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Tuami Lasri. Near-field scanning microwave microscope for subsurface non-destructive characterization. 45th European Microwave Conference (EuMC), Sep 2015, Paris, France. pp.155-158, ⟨10.1109/EuMC.2015.7345723⟩. ⟨hal-03224667⟩
27 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More