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Article Dans Une Revue IEEE Sensors Journal Année : 2016

Modeling and calibration in near-field microwave microscopy for dielectric constant and loss tangent measurement

Résumé

The characterization of liquid samples using evanescent microwave fields is described. A calibration model is developed to relate the measured near-field reflection coefficient to the local properties of the sample under test. As a demonstration, permittivity extraction of different sodium chloride solutions is experimentally determined. The accuracy of 0.3% and 1.3% is obtained for the dielectric constant and the loss tangent at 2.45 GHz.
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Dates et versions

hal-03224655 , version 1 (11-05-2021)

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H. Bakli, Kamel Haddadi, T. Lasri. Modeling and calibration in near-field microwave microscopy for dielectric constant and loss tangent measurement. IEEE Sensors Journal, 2016, 16 (12), pp.4667-4668. ⟨10.1109/JSEN.2016.2533608⟩. ⟨hal-03224655⟩
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