Variability Evaluation of 28nm FD-SOI Technology at Cryogenic Temperatures down to 100mK for Quantum Computing - Archive ouverte HAL Access content directly
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Variability Evaluation of 28nm FD-SOI Technology at Cryogenic Temperatures down to 100mK for Quantum Computing

B. Cardoso Paz
  • Function : Author
L. Le Guevel
M. Casse
  • Function : Author
G. Billiot
  • Function : Author
G. Pillonnet
S. Haendler
  • Function : Author
A. Juge
  • Function : Author
E. Vincent
  • Function : Author
P. Galy
  • Function : Author
G. Ghibaudo
  • Function : Author
M. Vinet
T. Meunier
  • Function : Author
F. Gaillard
  • Function : Author
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hal-03211508 , version 1 (28-04-2021)

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B. Cardoso Paz, L. Le Guevel, M. Casse, G. Billiot, G. Pillonnet, et al.. Variability Evaluation of 28nm FD-SOI Technology at Cryogenic Temperatures down to 100mK for Quantum Computing. 2020 IEEE Symposium on VLSI Technology, Jun 2020, Honolulu, France. pp.1-2, ⟨10.1109/VLSITechnology18217.2020.9265034⟩. ⟨hal-03211508⟩
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