Journal Articles Review of Scientific Instruments Year : 2008

Optical lever calibration in atomic force microscope with a mechanical lever

Abstract

A novel method that uses a small mechanical lever has been developed to directly calibrate the lateral sensitivity of the optical lever in the atomic force microscope (AFM). The mechanical lever can convert the translation into a nanoscale rotation angle with a flexible hinge that provides an accurate conversion between the photodiode voltage output and torsional angle of a cantilever. During the calibration, the cantilever is mounted on a holder attached on the lever, which brings the torsional axis of the cantilever and rotation axis of the lever into line. By making use of its nanomotion on the Z-axis and using an external motion on the barrier, this device can complete the local and full-range lateral sensitivity calibrations of the optical lever without modifying the actual AFM or the cantilevers.

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Dates and versions

hal-03191009 , version 1 (06-04-2021)

Identifiers

Cite

Hui Xie, Julien Vitard, Sinan Haliyo, Stéphane Régnier. Optical lever calibration in atomic force microscope with a mechanical lever. Review of Scientific Instruments, 2008, 79 (9), pp.096101. ⟨10.1063/1.2976108⟩. ⟨hal-03191009⟩
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