Journal Articles
Nanotechnology
Year : 2013
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https://hal.science/hal-03190995
Submitted on : Tuesday, April 6, 2021-6:27:00 PM
Last modification on : Friday, March 24, 2023-2:53:21 PM
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- HAL Id : hal-03190995 , version 1
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Juan Camilo Acosta, Jérôme Polesel-Maris, Frédéric Thoyer, Hui Xie, Sinan Haliyo, et al.. Gentle and fast atomic force microscopy with piezoelectric scanning probe for nanorobotics applications. Nanotechnology, 2013, 24 (6), pp.065502. ⟨hal-03190995⟩
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