Gentle and fast atomic force microscopy with piezoelectric scanning probe for nanorobotics applications - Archive ouverte HAL Access content directly
Journal Articles Nanotechnology Year : 2013
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hal-03190995 , version 1 (06-04-2021)

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  • HAL Id : hal-03190995 , version 1

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Juan Camilo Acosta, Jérôme Polesel-Maris, Frédéric Thoyer, Hui Xie, Sinan Haliyo, et al.. Gentle and fast atomic force microscopy with piezoelectric scanning probe for nanorobotics applications. Nanotechnology, 2013, 24 (6), pp.065502. ⟨hal-03190995⟩
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