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Conference Papers Year : 2021

BIST-Assisted Analog Fault Diagnosis

Abstract

Fault diagnosis methodologies for analog circuits lag far behind those for their digital counterparts. In this paper, we show how the generic Symmetry-based Built-In Self-Test (BIST) (or SymBIST), originally proposed for defect-oriented postmanufacturing test and on-line test, can be seamlessly reused for the purpose of diagnosis. BIST can offer better insights into the circuit and, thereby, can assist diagnosis towards resolving ambiguity groups. Using SymBIST we demonstrate high diagnosis resolution and fast diagnosis cycle for an industrial Successive Approximation Register (SAR) Analog-to-Digital Converter (ADC).
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Dates and versions

hal-03181937 , version 1 (26-03-2021)

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Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos. BIST-Assisted Analog Fault Diagnosis. 26th IEEE European Test Symposium, May 2021, Bruges (virtual), Belgium. pp.1-6, ⟨10.1109/ETS50041.2021.9465386⟩. ⟨hal-03181937⟩
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