An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials - Archive ouverte HAL
Article Dans Une Revue COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering Année : 2018

An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials

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Sciences de l'ingénieur [physics]

Yann Le Bihan  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-03146287

Soumis le : jeudi 18 février 2021-23:19:47

Dernière modification le : vendredi 22 novembre 2024-03:19:52

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hal-03146287 , version 1 (18-02-2021)

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Hakim Sadou, Tarik Hacib, Hulusi Acikgoz, Yann Le Bihan, Olivier Meyer, et al.. An approach based on ANFIS and input selection procedure for microwave characterization of dielectric materials. COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, 2018, 37 (2), pp.799-813. ⟨10.1108/COMPEL-05-2017-0208⟩. ⟨hal-03146287⟩

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